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SAE J1752/1 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurem

SAE J1752/1 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurem

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  • 商品货号:INFOEACH_54546
  • 商品品牌:美国机动车工程师学会 SAE
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  • 上架时间:2020-08-11
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Product Code:SAE J1752/1
Title:Electromagnetic Compatibility Measurement Procedures for Integrated Circuits-Integrated Circuit Emc Measurement Procedures-General and Definition
Issuing Committee:Electromagnetic Compatibility (Emc) Standards
Scope:This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752.The near field magnetic of electromagnetic radiation from an integrated circuit can be measured in a controlled manner that yields repeatable results. These emissions are related to the far field electromagnetic radiation potential of the IC and of the electronic module of which it is a part. The intent is to provide a quantitative measure of the RF emissions from ICs for comparison or other purposes. Similar quantitative measures of the immunity of an IC to RF fields and transients are being investigated.

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